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Call for Papers - ALT’2010
Accelerated Life Testing, Reliability-basedAnalysis and Design
19-21 May 2010, Clermont-Ferrand
Tuesday 10 November 2009 , Sandrine Beaujon


THEME

ALT’2010 is the 3rd international conference concerned with the latest scientific results and applications in reliability testing and analysis. The aim of this conference is to bring researchers and practitioners from universities, institutions and industries, together to present and discuss innovative methodologies and practical applications in the reliability field: assessment, testing, analysis, design and optimization. It also aims to combine the points of view related to reliability engineering and structural reliability. Theoretical issues and applied case studied, will range from academic considerations to industrial applications, including electronics, civil and mechanical engineering. There will be invited talks, plenary sessions and parallel sessions.

Knowing the success of previous ALT conferences, ALT’2010 intends to include wide reliability engineering methods and Industrial applications.

ALT’2010 is addressed to:

- University researchers, through innovative theoretical developments and scientific works.

- Industry engineers through practical applications and enginneering procedures and tools.

The conference includes:
- Keynote lectures
- Paper presentations
- Posters
- Exhibition space for institutions, companies, software and products.

It is also possible to propose a mini-symposium on a field of interest. In this case, please inform the organizers about the topic and the expected number of papers.

All submitted papers will be reviewed and selected by the program committees. Accepted papers will be published in the conference proceedings. Selected papers after revision will be published in special issues of international Journals (e.g. Papers selected from ALT’2006 has been published in JSPI).

The conference will take place at the city of Clermont-Ferrand, located in the wonderful volcanic site in the centre of France. A visit of the natural site is expected after the conference.

Topics of the conference

- Accelerated testing

- System reliability

- Probabilistic degradation models

- Coupled physical and statistical degradation models

- Structural and mechanical reliability

- Reliability-based design and optimization

- Life-cycle assessment and optimization

- Test planning and optimization

- Statistical Methods in Reliability

- Survival Data Analysis

- Analysis of failure data

- Rare and censored data

- Reliability prediction models

- In service reliability estimation

- System health monitoring

- Design of experiments and metamodels

- Industrial applications

SUBMISSION OF PAPERS

Jan. 31, 2010: Deadline for abstract submission

Feb. 15, 2010: Notification of acceptance

Mar. 31, 2010: Deadline for paper submission

The conference language is English

To know more :

http://polytech.univ-bpclermont.fr/ALT2010/

   


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